numam-dpdk/app/test/test_ring_hts_stress.c

33 lines
732 B
C
Raw Normal View History

/* SPDX-License-Identifier: BSD-3-Clause
* Copyright(c) 2020 Intel Corporation
*/
#include "test_ring_stress_impl.h"
static inline uint32_t
_st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
uint32_t *avail)
{
return rte_ring_mc_hts_dequeue_bulk(r, obj, n, avail);
}
static inline uint32_t
_st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
uint32_t *free)
{
return rte_ring_mp_hts_enqueue_bulk(r, obj, n, free);
}
static int
_st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
{
return rte_ring_init(r, name, num,
RING_F_MP_HTS_ENQ | RING_F_MC_HTS_DEQ);
}
const struct test test_ring_hts_stress = {
.name = "MT_HTS",
.nb_case = RTE_DIM(tests),
.cases = tests,
};