numam-dpdk/app/test-crypto-perf/cperf_test_throughput.h

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/* SPDX-License-Identifier: BSD-3-Clause
* Copyright(c) 2016-2017 Intel Corporation
app/crypto-perf: introduce performance test application This patchset introduce new application which allows measuring performance parameters of PMDs available in crypto tree. The goal of this application is to replace existing performance tests in app/test. Parameters available are: throughput (--ptest throughput) and latency (--ptest latency). User can use multiply cores to run tests on but only one type of crypto PMD can be measured during single application execution. Cipher parameters, type of device, type of operation and chain mode have to be specified in the command line as application parameters. These parameters are checked using device capabilities structure. Couple of new library functions in librte_cryptodev are introduced for application use. To build the application a CONFIG_RTE_APP_CRYPTO_PERF flag has to be set (it is set by default). Example of usage: -c 0xc0 --vdev crypto_aesni_mb_pmd -w 0000:00:00.0 -- --ptest throughput --devtype crypto_aesni_mb --optype cipher-then-auth --cipher-algo aes-cbc --cipher-op encrypt --cipher-key-sz 16 --auth-algo sha1-hmac --auth-op generate --auth-key-sz 64 --auth-digest-sz 12 --total-ops 10000000 --burst-sz 32 --buffer-sz 64 Signed-off-by: Declan Doherty <declan.doherty@intel.com> Signed-off-by: Slawomir Mrozowicz <slawomirx.mrozowicz@intel.com> Signed-off-by: Piotr Azarewicz <piotrx.t.azarewicz@intel.com> Signed-off-by: Marcin Kerlin <marcinx.kerlin@intel.com> Signed-off-by: Michal Kobylinski <michalx.kobylinski@intel.com>
2017-01-25 16:27:33 +00:00
*/
#ifndef _CPERF_THROUGHPUT_
#define _CPERF_THROUGHPUT_
#include <stdint.h>
#include <rte_mbuf.h>
#include "cperf.h"
#include "cperf_ops.h"
#include "cperf_options.h"
#include "cperf_test_vectors.h"
void *
cperf_throughput_test_constructor(
struct rte_mempool *sess_mp,
uint8_t dev_id,
uint16_t qp_id,
app/crypto-perf: introduce performance test application This patchset introduce new application which allows measuring performance parameters of PMDs available in crypto tree. The goal of this application is to replace existing performance tests in app/test. Parameters available are: throughput (--ptest throughput) and latency (--ptest latency). User can use multiply cores to run tests on but only one type of crypto PMD can be measured during single application execution. Cipher parameters, type of device, type of operation and chain mode have to be specified in the command line as application parameters. These parameters are checked using device capabilities structure. Couple of new library functions in librte_cryptodev are introduced for application use. To build the application a CONFIG_RTE_APP_CRYPTO_PERF flag has to be set (it is set by default). Example of usage: -c 0xc0 --vdev crypto_aesni_mb_pmd -w 0000:00:00.0 -- --ptest throughput --devtype crypto_aesni_mb --optype cipher-then-auth --cipher-algo aes-cbc --cipher-op encrypt --cipher-key-sz 16 --auth-algo sha1-hmac --auth-op generate --auth-key-sz 64 --auth-digest-sz 12 --total-ops 10000000 --burst-sz 32 --buffer-sz 64 Signed-off-by: Declan Doherty <declan.doherty@intel.com> Signed-off-by: Slawomir Mrozowicz <slawomirx.mrozowicz@intel.com> Signed-off-by: Piotr Azarewicz <piotrx.t.azarewicz@intel.com> Signed-off-by: Marcin Kerlin <marcinx.kerlin@intel.com> Signed-off-by: Michal Kobylinski <michalx.kobylinski@intel.com>
2017-01-25 16:27:33 +00:00
const struct cperf_options *options,
const struct cperf_test_vector *test_vector,
const struct cperf_op_fns *ops_fn);
int
cperf_throughput_test_runner(void *test_ctx);
void
cperf_throughput_test_destructor(void *test_ctx);
#endif /* _CPERF_THROUGHPUT_ */