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test/mem: fix page size for external memory

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Currently external memory test uses 4K page size.
VFIO DMA mapping works only with system page granularity.

Earlier it was working because all the contiguous mappings
were coalesced and mapped in one-go which ended up becoming
a lot bigger page. Now that VFIO DMA mappings both in IOVA as VA
and IOVA as PA mode, are being done at memseg list granularity,
we need to use system page size.

Fixes: b270daa43b ("test: support external memory")
Cc: stable@dpdk.org

Signed-off-by: Nithin Dabilpuram <ndabilpuram@marvell.com>
Acked-by: Anatoly Burakov <anatoly.burakov@intel.com>
This commit is contained in:
Nithin Dabilpuram 2021-01-15 13:02:43 +05:30 committed by David Marchand
parent c13ca4e81c
commit 52db57db05
1 changed files with 2 additions and 1 deletions
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3
app/test/test_external_mem.c
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@ -13,6 +13,7 @@
#include <rte_common.h>
#include <rte_debug.h>
#include <rte_eal.h>
#include <rte_eal_paging.h>
#include <rte_errno.h>
#include <rte_malloc.h>
#include <rte_ring.h>
@ -532,8 +533,8 @@ test_extmem_basic(void *addr, size_t len, size_t pgsz, rte_iova_t *iova,
static int
test_external_mem(void)
{
size_t pgsz = rte_mem_page_size();
size_t len = EXTERNAL_MEM_SZ;
size_t pgsz = RTE_PGSIZE_4K;
rte_iova_t iova[len / pgsz];
void *addr;
int ret, n_pages;