test/bpf: skip test if libpcap is unavailable
test_bpf_convert is being conditionally registered depending on the presence of RTE_HAS_LIBPCAP except the UT unconditionally lists it as a test to run. When the UT runs test_bpf_convert test-dpdk can't find the registration and assumes the DPDK_TEST environment variable hasn't been defined resulting in test-dpdk dropping to interactive mode and subsequently waiting for the remainder of the UT fast-test timeout period before reporting the test as having timed out. * unconditionally register test_bpf_convert, * if ! RTE_HAS_LIBPCAP provide a stub test_bpf_convert that reports the test is skipped similar to that done with the test_bpf test. Fixes: 2eccf6afbea9 ("bpf: add function to convert classic BPF to DPDK BPF") Cc: stable@dpdk.org Signed-off-by: Tyler Retzlaff <roretzla@linux.microsoft.com> Acked-by: Stephen Hemminger <stephen@networkplumber.org> Acked-by: Konstantin Ananyev <konstantin.ananyev@intel.com>
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@ -3264,7 +3264,16 @@ test_bpf(void)
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REGISTER_TEST_COMMAND(bpf_autotest, test_bpf);
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#ifdef RTE_HAS_LIBPCAP
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#ifndef RTE_HAS_LIBPCAP
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static int
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test_bpf_convert(void)
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{
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printf("BPF convert RTE_HAS_LIBPCAP is undefined, skipping test\n");
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return TEST_SKIPPED;
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}
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#else
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#include <pcap/pcap.h>
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static void
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@ -3462,5 +3471,6 @@ test_bpf_convert(void)
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return rc;
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}
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REGISTER_TEST_COMMAND(bpf_convert_autotest, test_bpf_convert);
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#endif /* RTE_HAS_LIBPCAP */
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REGISTER_TEST_COMMAND(bpf_convert_autotest, test_bpf_convert);
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