From 98a54d0ae6c68882e5df180c38f03091d77011f7 Mon Sep 17 00:00:00 2001 From: Bruce Richardson Date: Tue, 11 Jan 2022 13:41:05 +0000 Subject: [PATCH] test/dma: increase iterations of capacity test case To ensure we catch any bugs in calculation due to wrap-around of the id values, increase the number of iterations of the burst_capacity test. Signed-off-by: Bruce Richardson Acked-by: Kevin Laatz --- app/test/test_dmadev.c | 7 ++++--- 1 file changed, 4 insertions(+), 3 deletions(-) diff --git a/app/test/test_dmadev.c b/app/test/test_dmadev.c index b206db27ae..db5aff701c 100644 --- a/app/test/test_dmadev.c +++ b/app/test/test_dmadev.c @@ -686,10 +686,11 @@ test_burst_capacity(int16_t dev_id, uint16_t vchan) /* to test capacity, we enqueue elements and check capacity is reduced * by one each time - rebaselining the expected value after each burst * as the capacity is only for a burst. We enqueue multiple bursts to - * fill up half the ring, before emptying it again. We do this twice to - * ensure that we get to test scenarios where we get ring wrap-around + * fill up half the ring, before emptying it again. We do this multiple + * times to ensure that we get to test scenarios where we get ring + * wrap-around and wrap-around of the ids returned (at UINT16_MAX). */ - for (iter = 0; iter < 2; iter++) { + for (iter = 0; iter < 2 * (((int)UINT16_MAX + 1) / ring_space); iter++) { for (i = 0; i < (ring_space / (2 * CAP_TEST_BURST_SIZE)) + 1; i++) { cap = rte_dma_burst_capacity(dev_id, vchan);