test/hash: test more corner cases
This commit improves the readwrite unit test to cover more corner cases and reduces the testing time by reducing the total key count. Signed-off-by: Yipeng Wang <yipeng1.wang@intel.com> Acked-by: Bruce Richardson <bruce.richardson@intel.com>
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@ -18,8 +18,8 @@
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#define RTE_RWTEST_FAIL 0
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#define TOTAL_ENTRY (16*1024*1024)
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#define TOTAL_INSERT (15*1024*1024)
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#define TOTAL_ENTRY (5*1024*1024)
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#define TOTAL_INSERT (4.5*1024*1024)
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#define NUM_TEST 3
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unsigned int core_cnt[NUM_TEST] = {2, 4, 8};
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@ -59,8 +59,10 @@ test_hash_readwrite_worker(__attribute__((unused)) void *arg)
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uint64_t i, offset;
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uint32_t lcore_id = rte_lcore_id();
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uint64_t begin, cycles;
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int ret;
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int *ret;
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ret = rte_malloc(NULL, sizeof(int) *
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tbl_rw_test_param.num_insert, 0);
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for (i = 0; i < rte_lcore_count(); i++) {
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if (slave_core_ids[i] == lcore_id)
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break;
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@ -79,13 +81,30 @@ test_hash_readwrite_worker(__attribute__((unused)) void *arg)
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tbl_rw_test_param.keys + i) > 0)
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break;
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ret = rte_hash_add_key(tbl_rw_test_param.h,
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ret[i - offset] = rte_hash_add_key(tbl_rw_test_param.h,
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tbl_rw_test_param.keys + i);
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if (ret < 0)
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if (ret[i - offset] < 0)
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break;
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/* lookup a random key */
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uint32_t rand = rte_rand() % (i + 1 - offset);
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if (rte_hash_lookup(tbl_rw_test_param.h,
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tbl_rw_test_param.keys + rand) != ret[rand])
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break;
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if (rte_hash_del_key(tbl_rw_test_param.h,
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tbl_rw_test_param.keys + rand) != ret[rand])
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break;
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ret[rand] = rte_hash_add_key(tbl_rw_test_param.h,
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tbl_rw_test_param.keys + rand);
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if (ret[rand] < 0)
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break;
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if (rte_hash_lookup(tbl_rw_test_param.h,
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tbl_rw_test_param.keys + i) != ret)
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tbl_rw_test_param.keys + rand) != ret[rand])
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break;
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}
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@ -96,6 +115,7 @@ test_hash_readwrite_worker(__attribute__((unused)) void *arg)
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for (; i < offset + tbl_rw_test_param.num_insert; i++)
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tbl_rw_test_param.keys[i] = RTE_RWTEST_FAIL;
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rte_free(ret);
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return 0;
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}
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