Currently external memory test uses 4K page size.
VFIO DMA mapping works only with system page granularity.
Earlier it was working because all the contiguous mappings
were coalesced and mapped in one-go which ended up becoming
a lot bigger page. Now that VFIO DMA mappings both in IOVA as VA
and IOVA as PA mode, are being done at memseg list granularity,
we need to use system page size.
Fixes: b270daa43b ("test: support external memory")
Cc: stable@dpdk.org
Signed-off-by: Nithin Dabilpuram <ndabilpuram@marvell.com>
Acked-by: Anatoly Burakov <anatoly.burakov@intel.com>
Restrict this header inclusion to its real users.
Fixes: 028669bc9f ("eal: hide shared memory config")
Cc: stable@dpdk.org
Signed-off-by: David Marchand <david.marchand@redhat.com>
Acked-by: Anatoly Burakov <anatoly.burakov@intel.com>
Since all other apps have been moved to the "app" folder, the autotest app
remains alone in the test folder. Rather than having an entire top-level
folder for this, we can move it back to where it all started in early
versions of DPDK - the "app/" folder.
This move has a couple of advantages:
* This reduces clutter at the top level of the project, due to one less
folder.
* It eliminates the separate build task necessary for building the
autotests using make "make test-build" which means that developers are
less likely to miss something in their own compilation tests
* It re-aligns the final location of the test binary in the app folder when
building with make with it's location in the source tree.
For meson builds, the autotest app is different from the other apps in that
it needs a series of different test cases defined for it for use by "meson
test". Therefore, it does not get built as part of the main loop in the
app folder, but gets built separately at the end.
Signed-off-by: Bruce Richardson <bruce.richardson@intel.com>
