Improve logic:
* to get list of valid devices based on driver id so that to
eliminate unnecessary if check for driver id match in device loop
* loop till 1st device supporting asymmetric feature is found unlike
previous logic which breaks on 1st device
Signed-off-by: Kanaka Durga Kotamarthy <kkotamarthy@marvell.com>
Signed-off-by: Ayuj Verma <ayverma@marvell.com>
Acked-by: Akhil Goyal <akhil.goyal@nxp.com>
BT0 block type padding after rfc2313 has been discontinued.
Signed-off-by: Arek Kusztal <arkadiuszx.kusztal@intel.com>
Acked-by: Shally Verma <shallyv@marvell.com>
Asymmetric nature of RSA algorithm suggest to use
additional field for output. In place operations
still can be done by setting cipher and message pointers
with the same memory address.
Signed-off-by: Arek Kusztal <arkadiuszx.kusztal@intel.com>
Acked-by: Shally Verma <shallyv@marvell.com>
Currently some tests return TEST_SKIPPED/-1 when tests or params
are not supported for particular PMD because of which tests adds to
FAILED test counter in place of Skipped/Unsupported counter.
Since unsupported test is not a failure case,
replace return value TEST_SKIPPED/-1 with -ENOTSUP
- Return -ENOTSUP for unsupported tests
- add NULL check for rte_cryptodev_asym_capability_get()
- Typo correction
Signed-off-by: Ayuj Verma <ayverma@marvell.com>
Signed-off-by: Shally Verma <shallyv@marvell.com>
crypto pmds are queried to check if Sign and Decrypt
with CRT keys or exponent is supported, thus call
operation with relevant key type.
Signed-off-by: Ayuj Verma <ayverma@marvell.com>
Signed-off-by: Shally Verma <shallyv@marvell.com>
Acked-by: Akhil Goyal <akhil.goyal@nxp.com>
This patch adds new test structure for modexp
and modinv for asymmetric cryptography.
Signed-off-by: Damian Nowak <damianx.nowak@intel.com>
Acked-by: Arek Kusztal <arkadiuszx.kusztal@intel.com>
Acked-by: Fiona Trahe <fiona.trahe@intel.com>
This patch adds result field to modular exponentiation and
modular multiplicative inverse tests
Signed-off-by: Arek Kusztal <arkadiuszx.kusztal@intel.com>
Acked-by: Shally Verma <shallyv@marvell.com>
Since all other apps have been moved to the "app" folder, the autotest app
remains alone in the test folder. Rather than having an entire top-level
folder for this, we can move it back to where it all started in early
versions of DPDK - the "app/" folder.
This move has a couple of advantages:
* This reduces clutter at the top level of the project, due to one less
folder.
* It eliminates the separate build task necessary for building the
autotests using make "make test-build" which means that developers are
less likely to miss something in their own compilation tests
* It re-aligns the final location of the test binary in the app folder when
building with make with it's location in the source tree.
For meson builds, the autotest app is different from the other apps in that
it needs a series of different test cases defined for it for use by "meson
test". Therefore, it does not get built as part of the main loop in the
app folder, but gets built separately at the end.
Signed-off-by: Bruce Richardson <bruce.richardson@intel.com>
