6749637af9
Rename test_ring_peek_stress to test_ring_mt_peek_stress to keep same naming conventions for ST and MT test cases. Signed-off-by: Konstantin Ananyev <konstantin.ananyev@intel.com> Reviewed-by: Honnappa Nagarahalli <honnappa.nagarahalli@arm.com>
44 lines
916 B
C
44 lines
916 B
C
/* SPDX-License-Identifier: BSD-3-Clause
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* Copyright(c) 2020 Intel Corporation
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*/
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#include "test_ring_stress_impl.h"
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#include <rte_ring_elem.h>
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static inline uint32_t
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_st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
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uint32_t *avail)
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{
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uint32_t m;
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m = rte_ring_dequeue_bulk_start(r, obj, n, avail);
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n = (m == n) ? n : 0;
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rte_ring_dequeue_finish(r, n);
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return n;
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}
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static inline uint32_t
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_st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
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uint32_t *free)
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{
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uint32_t m;
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m = rte_ring_enqueue_bulk_start(r, n, free);
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n = (m == n) ? n : 0;
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rte_ring_enqueue_finish(r, obj, n);
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return n;
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}
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static int
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_st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
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{
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return rte_ring_init(r, name, num,
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RING_F_MP_HTS_ENQ | RING_F_MC_HTS_DEQ);
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}
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const struct test test_ring_mt_peek_stress = {
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.name = "MT_PEEK",
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.nb_case = RTE_DIM(tests),
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.cases = tests,
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};
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