numam-dpdk/app/test/test_ring_stress.c
Konstantin Ananyev 1cf65e4341 test/ring: add contention stress test for HTS ring
Introduce new test case to test HTS ring mode under contention.

Signed-off-by: Konstantin Ananyev <konstantin.ananyev@intel.com>
Acked-by: Honnappa Nagarahalli <honnappa.nagarahalli@arm.com>
2020-04-21 12:52:55 +02:00

55 lines
1.0 KiB
C

/* SPDX-License-Identifier: BSD-3-Clause
* Copyright(c) 2020 Intel Corporation
*/
#include "test_ring_stress.h"
static int
run_test(const struct test *test)
{
int32_t rc;
uint32_t i, k;
for (i = 0, k = 0; i != test->nb_case; i++) {
printf("TEST-CASE %s %s START\n",
test->name, test->cases[i].name);
rc = test->cases[i].func(test->cases[i].wfunc);
k += (rc == 0);
if (rc != 0)
printf("TEST-CASE %s %s FAILED\n",
test->name, test->cases[i].name);
else
printf("TEST-CASE %s %s OK\n",
test->name, test->cases[i].name);
}
return k;
}
static int
test_ring_stress(void)
{
uint32_t n, k;
n = 0;
k = 0;
n += test_ring_mpmc_stress.nb_case;
k += run_test(&test_ring_mpmc_stress);
n += test_ring_rts_stress.nb_case;
k += run_test(&test_ring_rts_stress);
n += test_ring_hts_stress.nb_case;
k += run_test(&test_ring_hts_stress);
printf("Number of tests:\t%u\nSuccess:\t%u\nFailed:\t%u\n",
n, k, n - k);
return (k != n);
}
REGISTER_TEST_COMMAND(ring_stress_autotest, test_ring_stress);