582581d578
Introduce new test case to test MT peek API. Signed-off-by: Konstantin Ananyev <konstantin.ananyev@intel.com> Acked-by: Honnappa Nagarahalli <honnappa.nagarahalli@arm.com>
39 lines
774 B
C
39 lines
774 B
C
/* SPDX-License-Identifier: BSD-3-Clause
|
|
* Copyright(c) 2020 Intel Corporation
|
|
*/
|
|
|
|
|
|
#include <inttypes.h>
|
|
#include <stddef.h>
|
|
#include <stdalign.h>
|
|
#include <string.h>
|
|
#include <stdio.h>
|
|
#include <unistd.h>
|
|
|
|
#include <rte_ring.h>
|
|
#include <rte_cycles.h>
|
|
#include <rte_launch.h>
|
|
#include <rte_pause.h>
|
|
#include <rte_random.h>
|
|
#include <rte_malloc.h>
|
|
#include <rte_spinlock.h>
|
|
|
|
#include "test.h"
|
|
|
|
struct test_case {
|
|
const char *name;
|
|
int (*func)(int (*)(void *));
|
|
int (*wfunc)(void *arg);
|
|
};
|
|
|
|
struct test {
|
|
const char *name;
|
|
uint32_t nb_case;
|
|
const struct test_case *cases;
|
|
};
|
|
|
|
extern const struct test test_ring_mpmc_stress;
|
|
extern const struct test test_ring_rts_stress;
|
|
extern const struct test test_ring_hts_stress;
|
|
extern const struct test test_ring_peek_stress;
|