6749637af9
Rename test_ring_peek_stress to test_ring_mt_peek_stress to keep same naming conventions for ST and MT test cases. Signed-off-by: Konstantin Ananyev <konstantin.ananyev@intel.com> Reviewed-by: Honnappa Nagarahalli <honnappa.nagarahalli@arm.com>
61 lines
1.2 KiB
C
61 lines
1.2 KiB
C
/* SPDX-License-Identifier: BSD-3-Clause
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* Copyright(c) 2020 Intel Corporation
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*/
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#include "test_ring_stress.h"
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static int
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run_test(const struct test *test)
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{
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int32_t rc;
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uint32_t i, k;
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for (i = 0, k = 0; i != test->nb_case; i++) {
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printf("TEST-CASE %s %s START\n",
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test->name, test->cases[i].name);
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rc = test->cases[i].func(test->cases[i].wfunc);
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k += (rc == 0);
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if (rc != 0)
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printf("TEST-CASE %s %s FAILED\n",
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test->name, test->cases[i].name);
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else
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printf("TEST-CASE %s %s OK\n",
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test->name, test->cases[i].name);
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}
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return k;
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}
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static int
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test_ring_stress(void)
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{
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uint32_t n, k;
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n = 0;
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k = 0;
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n += test_ring_mpmc_stress.nb_case;
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k += run_test(&test_ring_mpmc_stress);
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n += test_ring_rts_stress.nb_case;
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k += run_test(&test_ring_rts_stress);
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n += test_ring_hts_stress.nb_case;
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k += run_test(&test_ring_hts_stress);
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n += test_ring_mt_peek_stress.nb_case;
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k += run_test(&test_ring_mt_peek_stress);
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n += test_ring_st_peek_stress.nb_case;
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k += run_test(&test_ring_st_peek_stress);
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printf("Number of tests:\t%u\nSuccess:\t%u\nFailed:\t%u\n",
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n, k, n - k);
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return (k != n);
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}
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REGISTER_TEST_COMMAND(ring_stress_autotest, test_ring_stress);
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