Bruce Richardson c3eabff124 distributor: add unit tests ...

Add a set of unit tests and some basic performance test for the
distributor library. These tests cover all the major functionality of
the library on both distributor and worker sides.

Signed-off-by: Bruce Richardson <bruce.richardson@intel.com>
Tested-by: Waterman Cao <waterman.cao@intel.com>

2014-06-12 15:48:24 +02:00

..

autotest_data.py

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autotest_runner.py

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autotest_test_funcs.py

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autotest.py

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commands.c

distributor: add unit tests

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Makefile

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process.h

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test_acl.c

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test_acl.h

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test_alarm.c

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test_atomic.c

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test_byteorder.c

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test_cmdline_cirbuf.c

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test_cmdline_etheraddr.c

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test_cmdline_ipaddr.c

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test_cmdline_lib.c

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test_cmdline_num.c

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test_cmdline_portlist.c

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test_cmdline_string.c

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test_cmdline.c

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test_cmdline.h

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test_common.c

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test_cpuflags.c

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test_cycles.c

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test_debug.c

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test_devargs.c

devargs: use a comma instead of semicolon to separate key/values

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test_distributor_perf.c

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test_distributor.c

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test_eal_flags.c

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test_eal_fs.c

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test_errno.c

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test_func_reentrancy.c

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test_hash_perf.c

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test_hash.c

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test_interrupts.c

app/test: fix build without librte_cmdline

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test_ivshmem.c

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test_kni.c

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test_kvargs.c

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test_logs.c

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test_lpm6_routes.h

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test_lpm6.c

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test_lpm_routes.h

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test_lpm.c

lpm: introduce rte_lpm_lookupx4

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test_malloc.c

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test_mbuf.c

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test_memcpy_perf.c

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test_memcpy.c

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test_memory.c

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test_mempool_perf.c

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test_mempool.c

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test_memzone.c

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test_meter.c

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test_mp_secondary.c

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test_pci.c

pci: remove conditions on device definitions

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test_per_lcore.c

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test_pmd_ring.c

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test_power.c

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test_prefetch.c

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test_red.c

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test_ring_perf.c

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test_ring.c

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test_rwlock.c

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test_sched.c

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test_spinlock.c

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test_string_fns.c

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test_tailq.c

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test_timer_perf.c

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test_timer.c

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test_version.c

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test.c

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test.h

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