numam-dpdk/app/test/test_ring_mpmc_stress.c
Konstantin Ananyev bf28df24e9 test/ring: add contention stress test
Introduce stress test for ring enqueue/dequeue operations.
Performs the following pattern on each slave worker:
dequeue/read-write data from the dequeued objects/enqueue.
Serves as both functional and performance test of ring
enqueue/dequeue operations under high contention
(for both over committed and non-over committed scenarios).

Signed-off-by: Konstantin Ananyev <konstantin.ananyev@intel.com>
Acked-by: Honnappa Nagarahalli <honnappa.nagarahalli@arm.com>
2020-04-21 11:34:09 +02:00

32 lines
686 B
C

/* SPDX-License-Identifier: BSD-3-Clause
* Copyright(c) 2020 Intel Corporation
*/
#include "test_ring_stress_impl.h"
static inline uint32_t
_st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
uint32_t *avail)
{
return rte_ring_mc_dequeue_bulk(r, obj, n, avail);
}
static inline uint32_t
_st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
uint32_t *free)
{
return rte_ring_mp_enqueue_bulk(r, obj, n, free);
}
static int
_st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
{
return rte_ring_init(r, name, num, 0);
}
const struct test test_ring_mpmc_stress = {
.name = "MP/MC",
.nb_case = RTE_DIM(tests),
.cases = tests,
};