bf28df24e9
Introduce stress test for ring enqueue/dequeue operations. Performs the following pattern on each slave worker: dequeue/read-write data from the dequeued objects/enqueue. Serves as both functional and performance test of ring enqueue/dequeue operations under high contention (for both over committed and non-over committed scenarios). Signed-off-by: Konstantin Ananyev <konstantin.ananyev@intel.com> Acked-by: Honnappa Nagarahalli <honnappa.nagarahalli@arm.com>
32 lines
686 B
C
32 lines
686 B
C
/* SPDX-License-Identifier: BSD-3-Clause
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* Copyright(c) 2020 Intel Corporation
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*/
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#include "test_ring_stress_impl.h"
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static inline uint32_t
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_st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
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uint32_t *avail)
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{
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return rte_ring_mc_dequeue_bulk(r, obj, n, avail);
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}
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static inline uint32_t
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_st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
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uint32_t *free)
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{
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return rte_ring_mp_enqueue_bulk(r, obj, n, free);
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}
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static int
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_st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
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{
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return rte_ring_init(r, name, num, 0);
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}
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const struct test test_ring_mpmc_stress = {
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.name = "MP/MC",
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.nb_case = RTE_DIM(tests),
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.cases = tests,
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};
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