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test/bdevio: do unit tests on their own thread

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Previously unit tests were run
on the same thread that called
the SPDK init. The bdevio app
had 2 threads: one for init&ut
and one for I/O processing.
When doing any asynchronous I/O,
the init&ut thread was waiting
via pthread condition variable
for I/O thread to finish it's
work.

With upcoming virtio-initiator
RESET implementation, the reset
I/O has to be processed by
a poller on the init thread.
When init&ut thread sends an
RESET requests the app deadlocks,
as pollers on the UT thread
won't be processed until I/O
thread wakes the condition
variable.

This patch separates ut thread
from init, so that init can
run it's tasks in background
even when ut thread is waiting
for condition variable.

Change-Id: Id4b6962f4288e6a07354dbf1d3aec0d0fd9de916
Signed-off-by: Dariusz Stojaczyk <dariuszx.stojaczyk@intel.com>
Reviewed-on: https://review.gerrithub.io/382663
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
This commit is contained in:
Dariusz Stojaczyk 2017-10-16 17:14:36 +02:00 committed by Jim Harris
parent f67dddc6f4
commit 90440e1fe1
1 changed files with 49 additions and 20 deletions
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69
test/lib/bdev/bdevio/bdevio.c
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@ -46,6 +46,9 @@
#define BUFFER_SIZE 260 * 1024
#define BDEV_TASK_ARRAY_SIZE 2048
#define LCORE_ID_INIT 0
#define LCORE_ID_UT 1
#define LCORE_ID_IO 2
#include "../common.c"
@ -76,7 +79,7 @@ execute_spdk_function(spdk_event_fn fn, void *arg1, void *arg2)
{
struct spdk_event *event;
event = spdk_event_allocate(1, fn, arg1, arg2);
event = spdk_event_allocate(LCORE_ID_IO, fn, arg1, arg2);
pthread_mutex_lock(&g_test_mutex);
spdk_event_call(event);
pthread_cond_wait(&g_test_cond, &g_test_mutex);
@ -700,30 +703,38 @@ blockdev_test_reset(void)
}
static void
test_main(void *arg1)
__stop_init_thread(void *arg1, void *arg2)
{
unsigned num_failures = (unsigned)(uintptr_t)arg1;
bdevio_cleanup_targets();
spdk_app_stop(num_failures);
}
static void
stop_init_thread(unsigned num_failures)
{
struct spdk_event *event;
event = spdk_event_allocate(LCORE_ID_UT, __stop_init_thread, (void *)(uintptr_t)num_failures, NULL);
spdk_event_call(event);
}
static void
__run_ut_thread(void *arg1, void *arg2)
{
CU_pSuite suite = NULL;
unsigned int num_failures;
spdk_poller_unregister(&g_start_timer, NULL);
pthread_mutex_init(&g_test_mutex, NULL);
pthread_cond_init(&g_test_cond, NULL);
if (bdevio_construct_targets() < 0) {
spdk_app_stop(-1);
return;
}
unsigned num_failures;
if (CU_initialize_registry() != CUE_SUCCESS) {
spdk_app_stop(CU_get_error());
stop_init_thread(CU_get_error());
return;
}
suite = CU_add_suite("components_suite", NULL, NULL);
if (suite == NULL) {
CU_cleanup_registry();
spdk_app_stop(CU_get_error());
stop_init_thread(CU_get_error());
return;
}
@ -756,7 +767,7 @@ test_main(void *arg1)
blockdev_test_reset) == NULL
) {
CU_cleanup_registry();
spdk_app_stop(CU_get_error());
stop_init_thread(CU_get_error());
return;
}
@ -764,14 +775,32 @@ test_main(void *arg1)
CU_basic_run_tests();
num_failures = CU_get_number_of_failures();
CU_cleanup_registry();
bdevio_cleanup_targets();
spdk_app_stop(num_failures);
stop_init_thread(num_failures);
}
static void
test_main(void *arg1)
{
struct spdk_event *event;
spdk_poller_unregister(&g_start_timer, NULL);
pthread_mutex_init(&g_test_mutex, NULL);
pthread_cond_init(&g_test_cond, NULL);
if (bdevio_construct_targets() < 0) {
spdk_app_stop(-1);
return;
}
event = spdk_event_allocate(LCORE_ID_UT, __run_ut_thread, NULL, NULL);
spdk_event_call(event);
}
static void
start_timer(void *arg1, void *arg2)
{
spdk_poller_register(&g_start_timer, test_main, NULL, spdk_env_get_current_core(), 1000 * 1000);
spdk_poller_register(&g_start_timer, test_main, NULL, LCORE_ID_INIT, 1000 * 1000);
}
int
@ -786,7 +815,7 @@ main(int argc, char **argv)
} else {
config_file = argv[1];
}
bdevtest_init(config_file, "0x3", &opts);
bdevtest_init(config_file, "0x7", &opts);
num_failures = spdk_app_start(&opts, start_timer, NULL, NULL);
spdk_app_fini();