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test/opal: fix a typo for P4510 devices ID

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Change-Id: Ic30fe63a60d2a151a47444fa84e1c99d9b69a454
Signed-off-by: WANGHAILIANG <hailiangx.e.wang@intel.com>
Reviewed-on: https://review.spdk.io/gerrit/c/spdk/spdk/+/3829
Community-CI: Mellanox Build Bot
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Tomasz Zawadzki <tomasz.zawadzki@intel.com>
Reviewed-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
This commit is contained in:
WANGHAILIANG 2020-08-18 13:37:37 +08:00 committed by Tomasz Zawadzki
parent c67fb06d51
commit c4e1d35c13
1 changed files with 1 additions and 1 deletions
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2
test/nvme/nvme_opal.sh
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@ -9,7 +9,7 @@ source "$rootdir/scripts/common.sh"
source "$rootdir/test/common/autotest_common.sh"
# The OPAL CI tests is only used for P4510 devices.
mapfile -t bdfs < <(get_nvme_bdfs_by_id 0x0a59)
mapfile -t bdfs < <(get_nvme_bdfs_by_id 0x0a54)
if [[ -z ${bdfs[0]} ]]; then
echo "No P4510 device found, exit the tests"
exit 1