test/bdevperf: fix memory leak if opening a descriptor fails

This was probably overlooked when developing 57d174ff6.

Fixes: 57d174ff6 ("bdev: add spdk_bdev_open/close")
Change-Id: Idb30287e740ac0300a5c7dc9fad7e06693f58330
Signed-off-by: Dariusz Stojaczyk <dariuszx.stojaczyk@intel.com>
Reviewed-on: https://review.gerrithub.io/398585
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
This commit is contained in:
Dariusz Stojaczyk 2018-02-06 14:47:29 +01:00 committed by Jim Harris
parent 25191ba7ab
commit ea88aefbf8

View File

@ -206,6 +206,8 @@ bdevperf_construct_targets(void)
rc = spdk_bdev_open(bdev, true, NULL, NULL, &target->bdev_desc);
if (rc != 0) {
SPDK_ERRLOG("Could not open leaf bdev %s, error=%d\n", spdk_bdev_get_name(bdev), rc);
free(target->name);
free(target);
bdev = spdk_bdev_next_leaf(bdev);
continue;
}