fio: Remove the trim step from full_bench.fio

The test already writes to the entire device twice, so
the trim step does not actually accomplish anything.

Change-Id: Ie761389511196d659358f18f557feb80087628cc
Signed-off-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-on: https://review.gerrithub.io/393832
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
This commit is contained in:
Ben Walker 2018-01-05 15:04:42 -07:00 committed by Jim Harris
parent 58d46f298f
commit feb082a24a

View File

@ -8,12 +8,6 @@ norandommap=1
cpumask=1
percentile_list=50:99:99.9:99.99:99.999
[precondition-trim]
description="Trim the entire device"
rw=trim
iodepth=128
bs=1M
[precondition-sequential]
stonewall
description="Sequentially write to the device twice"