For DIF and DIX, read strip and write insert operation will copy
data together with DIF generation and verification.
This patch adds spdk_crc16_t10dif_copy for those cases.
Change-Id: I9a77fa8b367486fe0b6704d58dcdf95d5210c875
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/437461
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Add init_crc parameter as seed value to spdk_crc16_t10dif API to generate
a CRC value spanning multiple separate buffers.
This will be necessary for upcoming DIF/DIX patches.
Having init_crc parameter is general, and so change the existing API
without adding seed version of the existing API.
Change-Id: I0ac7919b18013967e41829dcedd3e4e73204d5d6
Signed-off-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-on: https://review.gerrithub.io/437204
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Change-Id: I7174f1799361b8337ff5590b90ad6a0564ca8e9b
Signed-off-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-on: https://review.gerrithub.io/391899
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
