This will be used to simulate multi-threading for
bdev unit tests.
While here, alphabetize the existing calls - calloc
had been inserted out of order in a couple of places.
Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: I559cd1fd79e78f03ebdac313e0bbedbcdde4a8c1
Reviewed-on: https://review.gerrithub.io/377968
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Paul Luse <paul.e.luse@intel.com>
Most of the work here revolves around having to split
an I/O that spans a cluster boundary. In this case
we need to allocate a separate iov array, and then
issue each sub-I/O serially, copying the relevant
subset of the original iov array.
Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: I0d46b3f832245900d109ee6c78cc6d49cf96428b
Reviewed-on: https://review.gerrithub.io/374880
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Includes macros for wrappers (for syscalls) and stubs
(for SPDK functions) including an example of syscall
wrapper as well as a stub with both pointer and non
pointer values.
Change-Id: I9b19d81d5b9cbf2bbb327f58dbf985b3b253e800
Signed-off-by: Paul Luse <paul.e.luse@intel.com>
Reviewed-on: https://review.gerrithub.io/366348
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
This patch doesn't use it yet but sets up the ability to so that
upcoming unit test pathces can. The next patch will include use
of wrap in one nvme UT and then following that the wrap and
today's use of globally controlled stubs will be morphed into a
simple mock type capability for spdk unit tests.
Change-Id: I252160266f0b5c76e50fd213cb3e1686d48b9d0e
Signed-off-by: Paul Luse <paul.e.luse@intel.com>
Reviewed-on: https://review.gerrithub.io/363441
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
