Currently, the nightly tests are hanging due to the AER test program,
which waits for a temperature threshold event to occur. The QEMU
emulated NVMe controller (as well as the SPDK NVMe-oF target virtual
controller) don't emulate this condition, so the test never finishes.
Change-Id: I41a216f77ffbb3beaef2fdf7533fe62c36033fc6
Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-on: https://review.gerrithub.io/389908
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Add test script to use SPDK Nvmf with NVML backends and run FIO read/write
traffic with verify flag enabled.
Change-Id: Iff8a85f65c36cb7372963076252577b7a1b2378f
Signed-off-by: lgalkax <lukaszx.galka@intel.com>
Signed-off-by: Karol Latecki <karol.latecki@intel.com>
Reviewed-on: https://review.gerrithub.io/379247
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
This testcase will help test on bdev constructed
by remote device exported by NVMe-oF target.
Change-Id: I9a561f43132ab68b9f031702647fa92d6aee156b
Signed-off-by: Ziye Yang <optimistyzy@gmail.com>
Reviewed-on: https://review.gerrithub.io/379224
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Test for veryfing correct interoperability of nvmf with
use of lvol store / lvol bdev backends.
Also added initial test plan in which test is described.
Change-Id: Ided093091847dff2bca76063926798d5606d73bd
Signed-off-by: Karol Latecki <karol.latecki@intel.com>
Reviewed-on: https://review.gerrithub.io/377529
Reviewed-by: Tomasz Zawadzki <tomasz.zawadzki@intel.com>
Reviewed-by: Maciej Szwed <maciej.szwed@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
The stub application will ensure that each
nvmf test does not need to reinitialized DPDK
memory and NVMe devices. This drastically
cuts down on the amount of time needed to run
all of the nvmf tests.
Change-Id: I6abad4e1298111884f18026e72e36f5d8b73c4b9
Signed-off-by: cunyinch <cunyin.chang@intel.com>
Reviewed-on: https://review.gerrithub.io/362810
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
