Change-Id: I2cc6c494bacbeec1ba725b4b3d78a1f4a2ed39d1
Signed-off-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-on: https://review.gerrithub.io/406166
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Several intermittent test failures have been seen with recent
changes to this test. Disabling it for now while the issue
is debugged further.
Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: I0634f182dab3d3d259690981474866a2037c7fce
Reviewed-on: https://review.gerrithub.io/406454
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Users can use RPC to add/remove a namespace to/from
existing NVMe controller, SPDK NVMeoF target will
generate an asynchronous event as an indication to
host when asynchronous event request is available.
While here, we also set the event with invalid log
identifier, so that the host doesn't need to clear
the event. Users can use Set Feature to disable
such event.
Change-Id: I93c4d752f552d3c86c53e80877aa61c093e167cc
Signed-off-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-on: https://review.gerrithub.io/398759
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
This has been replaced with a pmem component-level test.
Change-Id: I3c433d9edbb4c4f0ff26d7716cd11ee9df5c0ad7
Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-on: https://review.gerrithub.io/405910
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-by: Karol Latecki <karol.latecki@intel.com>
Introduce RUN_NIGHTLY_FAILING flag for nightly tests
that are always or periodically failing.
A new cron job will be added to run test with this flag.
RUN_NIGHTLY_FAILING is set for:
test/vhost/readonly/readonly.sh
test/nvmf/multiconnection/multiconnection.sh
a fio job in test/lib/bdev/blockdev.sh
Change-Id: I32640c0d4b916156c2ee996a9847c7c9e64941f8
Signed-off-by: Pawel Niedzwiecki <pawelx.niedzwiecki@intel.com>
Reviewed-on: https://review.gerrithub.io/403985
Reviewed-by: Karol Latecki <karol.latecki@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Tomasz Zawadzki <tomasz.zawadzki@intel.com>
This is the first step in reorganizing the spdk test heirarchy.
Change-Id: I83467653af2da2a53251649092bed6902d6cb86e
Signed-off-by: Seth Howell <seth.howell@intel.com>
Reviewed-on: https://review.gerrithub.io/401707
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
This test ran for 10 minutes, which is half of the allotted time for the
entire nightly test run.
While we're here, remove some of the duplication - we don't need to run
both the nightly long run and the shorter normal test run of the same
test, and they should be grouped together.
Change-Id: I66385054d425fb8b032e282050fd39e927a8eb80
Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-on: https://review.gerrithub.io/393095
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Seth Howell <seth.howell5141@gmail.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Currently, the nightly tests are hanging due to the AER test program,
which waits for a temperature threshold event to occur. The QEMU
emulated NVMe controller (as well as the SPDK NVMe-oF target virtual
controller) don't emulate this condition, so the test never finishes.
Change-Id: I41a216f77ffbb3beaef2fdf7533fe62c36033fc6
Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-on: https://review.gerrithub.io/389908
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Add test script to use SPDK Nvmf with NVML backends and run FIO read/write
traffic with verify flag enabled.
Change-Id: Iff8a85f65c36cb7372963076252577b7a1b2378f
Signed-off-by: lgalkax <lukaszx.galka@intel.com>
Signed-off-by: Karol Latecki <karol.latecki@intel.com>
Reviewed-on: https://review.gerrithub.io/379247
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
This testcase will help test on bdev constructed
by remote device exported by NVMe-oF target.
Change-Id: I9a561f43132ab68b9f031702647fa92d6aee156b
Signed-off-by: Ziye Yang <optimistyzy@gmail.com>
Reviewed-on: https://review.gerrithub.io/379224
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Test for veryfing correct interoperability of nvmf with
use of lvol store / lvol bdev backends.
Also added initial test plan in which test is described.
Change-Id: Ided093091847dff2bca76063926798d5606d73bd
Signed-off-by: Karol Latecki <karol.latecki@intel.com>
Reviewed-on: https://review.gerrithub.io/377529
Reviewed-by: Tomasz Zawadzki <tomasz.zawadzki@intel.com>
Reviewed-by: Maciej Szwed <maciej.szwed@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
The stub application will ensure that each
nvmf test does not need to reinitialized DPDK
memory and NVMe devices. This drastically
cuts down on the amount of time needed to run
all of the nvmf tests.
Change-Id: I6abad4e1298111884f18026e72e36f5d8b73c4b9
Signed-off-by: cunyinch <cunyin.chang@intel.com>
Reviewed-on: https://review.gerrithub.io/362810
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
