Jim Harris 5dff1923b6 test/nvme: use stub to accelerate test time ... For now, just hardcode the shm_id to 0 for any test apps that currently do not support command-line arguments. Signed-off-by: Jim Harris <james.r.harris@intel.com> Change-Id: Ic8de44d4badc4c9b8858596b7f55dcc04371371b Reviewed-on: https://review.gerrithub.io/365732 Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com> Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>		2017-06-16 15:27:13 -04:00
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aer	env_dpdk: save and restore optind in spdk_env_init	2017-06-13 17:39:38 -04:00
e2edp	test/nvme: use stub to accelerate test time	2017-06-16 15:27:13 -04:00
overhead	test/nvme: use stub to accelerate test time	2017-06-16 15:27:13 -04:00
reset	env_dpdk: save and restore optind in spdk_env_init	2017-06-13 17:39:38 -04:00
sgl	test/nvme: use stub to accelerate test time	2017-06-16 15:27:13 -04:00
unit	test: add one unit test showing example of ut_mock wrap	2017-06-15 13:46:19 -04:00
hotplug.sh	test/nvme: detect the online NVMe devices before the setup.sh.	2017-06-16 14:06:14 -04:00
Makefile	nvme: add new test application to measure SW overhead	2016-08-01 12:58:30 -07:00
nvme.sh	test/nvme: use stub to accelerate test time	2017-06-16 15:27:13 -04:00
nvmemp.sh	nvme: detach the pci device with calling process's own devhandle	2017-05-16 10:35:29 -07:00