Tomasz Kulasek
002d49fe17
test/iscsi_tgt: fix fio nightly test
fio write test on null bdev always fails.
This patch replaces null bdev with malloc bdev to perform write test.
Change-Id: I3192da5445c510227f53209cf27d819b58b3b6e0
Signed-off-by: Tomasz Kulasek <tomaszx.kulasek@intel.com>
Reviewed-on: https://review.gerrithub.io/c/spdk/spdk/+/461905
Reviewed-by: Darek Stojaczyk <dariusz.stojaczyk@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
2019-07-16 14:38:14 +00:00
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