Seth Howell 51ce4dd231 test/unit: fix newly introduced scan-build errors ... The type of malloc used in some of the NVMe functions changed and has re-introduced some scan-build failures. Change-Id: I2055260c256429a1a2c6404a6d87605807d4170e Signed-off-by: Seth Howell <seth.howell@intel.com> Reviewed-on: https://review.gerrithub.io/424573 Tested-by: SPDK CI Jenkins <sys_sgci@intel.com> Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com> Reviewed-by: Ben Walker <benjamin.walker@intel.com> Reviewed-by: Jim Harris <james.r.harris@intel.com>		2018-09-04 22:21:39 +00:00
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include	test: use spdk.unittest.mk for histogram_data.h unit tests	2018-02-14 11:07:05 -05:00
lib	test/unit: fix newly introduced scan-build errors	2018-09-04 22:21:39 +00:00
Makefile	test: add histogram unit tests	2017-12-29 14:20:48 -05:00
unittest.sh	test/unit: add app.c unittests	2018-08-22 20:33:53 +00:00