numam-spdk/test
Cunyin Chang 6e82aa5ace nvme: Add support of hot remove vfio-attached devices in pcie layer.
Change-Id: Ia7d6ca2d6c0bec6345f05718f6a6328eccda2dcc
Signed-off-by: Cunyin Chang <cunyin.chang@intel.com>
Reviewed-on: https://review.gerrithub.io/391329
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
2017-12-19 13:07:20 -05:00
..
app nbd: add NBD subsystem to apps 2017-12-12 13:36:22 -05:00
blobfs/rocksdb test/rocksdb: reduce test time for per-patch tests 2017-12-15 15:48:06 -05:00
config test/vm_setup.sh: add missing packages from pkgdep.sh 2017-12-15 16:16:31 -05:00
cpp_headers build: include spdk.app.mk in all app Makefiles 2017-11-15 17:57:07 -05:00
iscsi_tgt test/iscsi: reduce per-patch test times 2017-12-15 15:48:06 -05:00
lib bdevperf: change type of io_completed to uint64_t 2017-12-19 11:58:30 -05:00
lvol test/lvol: Replace stop/start vhost with add/delete bdev 2017-12-13 11:26:54 -05:00
nvmf nvmf: add support of hotplug for nvmf. 2017-12-15 16:14:02 -05:00
pmem bdev/pmem: require name in construct_pmem_bdev RPC 2017-12-04 18:51:14 -05:00
unit nvme: Add support of hot remove vfio-attached devices in pcie layer. 2017-12-19 13:07:20 -05:00
vhost test: add timing calls to vhost/initiator/blockdev.sh 2017-12-19 11:10:57 -05:00
Makefile test: begin moving unit tests into test/unit 2017-06-16 16:43:48 -04:00
spdk_cunit.h include: Move the remainder of the code base to stdinc.h 2017-05-08 13:20:36 -07:00