The NVMe AER test tries to submit a large number of Get Features
commands during the test cycle to ensure that admin queue wraparound
works and other commands can be issued while still handling AERs
correctly. However, it tried to do this by submitting all of the Get
Features commands up front, which runs out of admin queue nvme_request
objects.
Change the test to submit one Get Features command per device and
resubmit it as it completes until the test is over. This exercises
the queue wraparound case without submitting a large number of requests
at once, and it also simplifies the test code.
Change-Id: I7cf865b6a8d821f62bba3d889cd21fc929a4d484
Signed-off-by: Daniel Verkamp <daniel.verkamp@intel.com>
Reviewed-on: https://review.gerrithub.io/366149
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Ziye Yang <optimistyzy@gmail.com>
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