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This patch doesn't use it yet but sets up the ability to so that upcoming unit test pathces can. The next patch will include use of wrap in one nvme UT and then following that the wrap and today's use of globally controlled stubs will be morphed into a simple mock type capability for spdk unit tests. Change-Id: I252160266f0b5c76e50fd213cb3e1686d48b9d0e Signed-off-by: Paul Luse <paul.e.luse@intel.com> Reviewed-on: https://review.gerrithub.io/363441 Tested-by: SPDK Automated Test System <sys_sgsw@intel.com> Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com> Reviewed-by: Ben Walker <benjamin.walker@intel.com> |
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spdk_internal |