numam-spdk/test/ocf
Marcin Dziegielewski a3cb1debb0 test/ocf: change backend device in persistent-metadata test
This patch is related to issue #815. To avoid hung and re-enable
testing this part of ocf, this patch changes backed device from aio to
nvme.

Hung in this test was caused by implementation of AIO bdev and bdev layer.
All AIO bdevs are using the same shared context with limited queue depth,
so in some cases AIO can return NOMEM status. It's ok when we have more
than one IO from bdev layer perspective, if not we will stuck because
nothing will triger retry io procedure.

This patch only enables testing and are not fixing root cause of hung.

To prevent before unexpected behavior of this and next one test we
need to clear ocf metadata on nvme device.

This patch also reenables this test in CI.

Signed-off-by: Marcin Dziegielewski <marcin.dziegielewski@intel.com>
Change-Id: Ibab4aefb9aaf33d725db20345bd5c09c1e5eebdd
Reviewed-on: https://review.gerrithub.io/c/spdk/spdk/+/463605
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Tomasz Zawadzki <tomasz.zawadzki@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Broadcom SPDK FC-NVMe CI <spdk-ci.pdl@broadcom.com>
Reviewed-by: Vitaliy Mysak <vitaliy.mysak@intel.com>
2019-08-28 15:21:53 +00:00
..
integrity test/ocf: disable norandommap flag 2019-06-07 18:18:42 +00:00
management test/ocf: change backend device in persistent-metadata test 2019-08-28 15:21:53 +00:00
ocf.sh test/ocf: change backend device in persistent-metadata test 2019-08-28 15:21:53 +00:00