numam-spdk/test/unit/lib/bdev
Dariusz Stojaczyk 73358c99e1 util/nvme: added io_device unregister callback
Patch afe860ae deferred freeing the io_device. However, for nvme, the
io_device context (spdk_nvme_ctrlr) is still being destructed before
io_channels are destroyed, causing segfaults on hotremove.

This patch defers io_device context destruction and fixes nvme
hotremove.

Fixes: afe860aeb1 ("channel: Correctly defer unregisters if channels exist")
Fixes: 5533c3d208 ("util: defer put_io_channel")

Change-Id: I7af699174cac0c6c6a6faa2cc65418c47347eb9a
Signed-off-by: Dariusz Stojaczyk <dariuszx.stojaczyk@intel.com>
Reviewed-on: https://review.gerrithub.io/370459
Tested-by: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Daniel Verkamp <daniel.verkamp@intel.com>
2017-07-20 16:07:02 -04:00
..
bdev.c util/nvme: added io_device unregister callback 2017-07-20 16:07:02 -04:00
scsi_nvme.c test: move SCSI/NVMe translation test to test/unit 2017-06-20 13:46:07 -04:00
Makefile test: add unit test framework for bdev.c 2017-07-05 15:09:46 -04:00