Darek Stojaczyk bb64a7e511 ut/bdev_mt: fix io_channel leak in "unregister_and_close"
We didn't call teardown_test() in "unregister_and_close"
test case, causing the subsequent test case to fail
to register the same io_channel. This didn't cause any
issues, as spdk_io_device_register() silently returned
if the same io_device was already registered. However,
there was an extra error message printed and this patch
gets rid of it.

```
  Test: unregister_and_close ...passed
  Test: basic_qos ...thread.c: 850:spdk_io_device_register: *ERROR*:
io_device 0x55555576e4e0 already registered (old:0x555555770ab0
new:0x55555d7a14d0)
passed
```

Change-Id: Ib554612df8985c9d99b46b71bb76020f52565362
Signed-off-by: Darek Stojaczyk <dariusz.stojaczyk@intel.com>
Reviewed-on: https://review.gerrithub.io/c/spdk/spdk/+/450111
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Reviewed-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
2019-04-05 16:21:58 +00:00
..
2019-04-02 21:40:21 +00:00