1. Use the Raid-0 bdev which based two Malloc bdevs to run
the fio test.
2. Use the Raid-0 bdev which based one Nvme bdev and one
malloc bdev to run fio test.
3. Creating lvol store on device Raid-0 which is based on
two Malloc bdevs.
Change-Id: I3fb5e5d8e445a236a6a4e8c198a6f54a1f488989
Signed-off-by: Chen Wang <chenx.wang@intel.com>
Reviewed-on: https://review.gerrithub.io/425546
Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Reviewed-by: Pawel Wodkowski <pawelx.wodkowski@intel.com>
Reviewed-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>
Reviewed-by: Piotr Pelpliński <piotr.pelplinski@intel.com>
Reviewed-by: Jim Harris <james.r.harris@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
efae4a1baa