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test/dma: increase iterations of capacity test case

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To ensure we catch any bugs in calculation due to wrap-around of the id
values, increase the number of iterations of the burst_capacity test.

Signed-off-by: Bruce Richardson <bruce.richardson@intel.com>
Acked-by: Kevin Laatz <kevin.laatz@intel.com>
This commit is contained in:
Bruce Richardson 2022-01-11 13:41:05 +00:00 committed by Thomas Monjalon
parent 63990aeb08
commit 98a54d0ae6
1 changed files with 4 additions and 3 deletions
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7
app/test/test_dmadev.c
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@ -686,10 +686,11 @@ test_burst_capacity(int16_t dev_id, uint16_t vchan)
/* to test capacity, we enqueue elements and check capacity is reduced
* by one each time - rebaselining the expected value after each burst
* as the capacity is only for a burst. We enqueue multiple bursts to
* fill up half the ring, before emptying it again. We do this twice to
* ensure that we get to test scenarios where we get ring wrap-around
* fill up half the ring, before emptying it again. We do this multiple
* times to ensure that we get to test scenarios where we get ring
* wrap-around and wrap-around of the ids returned (at UINT16_MAX).
*/
for (iter = 0; iter < 2; iter++) {
for (iter = 0; iter < 2 * (((int)UINT16_MAX + 1) / ring_space); iter++) {
for (i = 0; i < (ring_space / (2 * CAP_TEST_BURST_SIZE)) + 1; i++) {
cap = rte_dma_burst_capacity(dev_id, vchan);