numam-dpdk/app/test-crypto-perf
Sergio Gonzalez Monroy 15b55dd751 app/crypto-perf: return crypto ops to mempool in bulk
Use rte_mempool_put_bulk for both latency and throughput tests instead
of rte_crypto_op_free to improve application performance.

Signed-off-by: Sergio Gonzalez Monroy <sergio.gonzalez.monroy@intel.com>
Acked-by: Fiona Trahe <fiona.trahe@intel.com>
2017-07-06 17:15:49 +02:00
..
data app/crypto-perf: fix AES CBC 128 test vectors 2017-04-06 00:17:44 +02:00
cperf_ops.c app/crypto-perf: fix digest data for chained mbufs 2017-07-06 17:15:49 +02:00
cperf_ops.h app/crypto-perf: move verify as single test type 2017-04-06 00:17:44 +02:00
cperf_options_parsing.c app/crypto-perf: fix error message 2017-06-28 19:59:22 +02:00
cperf_options.h app/crypto-perf: reorg options structure 2017-04-06 00:17:44 +02:00
cperf_test_latency.c app/crypto-perf: return crypto ops to mempool in bulk 2017-07-06 17:15:49 +02:00
cperf_test_latency.h app/crypto-perf: introduce performance test application 2017-01-30 17:46:36 +01:00
cperf_test_throughput.c app/crypto-perf: return crypto ops to mempool in bulk 2017-07-06 17:15:49 +02:00
cperf_test_throughput.h app/crypto-perf: introduce performance test application 2017-01-30 17:46:36 +01:00
cperf_test_vector_parsing.c app/crypto-perf: add range/list of sizes 2017-04-06 00:17:44 +02:00
cperf_test_vector_parsing.h app/crypto-perf: introduce performance test application 2017-01-30 17:46:36 +01:00
cperf_test_vectors.c app/crypto-perf: fix AEAD tests when AAD is zero 2017-04-20 11:32:45 +02:00
cperf_test_vectors.h app/crypto-perf: introduce performance test application 2017-01-30 17:46:36 +01:00
cperf_test_verify.c app/crypto-perf: add range/list of sizes 2017-04-06 00:17:44 +02:00
cperf_test_verify.h app/crypto-perf: move verify as single test type 2017-04-06 00:17:44 +02:00
cperf.h app/crypto-perf: introduce performance test application 2017-01-30 17:46:36 +01:00
main.c app/crypto-perf: add range/list of sizes 2017-04-06 00:17:44 +02:00
Makefile app/crypto-perf: move verify as single test type 2017-04-06 00:17:44 +02:00